For example: in the 1MHz test frequency, the allocation will be 250 mu H inductor,in the 50MHz test frequency, the allocation will be 0.1 mu H inductors.

高頻介質(zhì)樣品（選購件）：

High frequency dielectric samples (optional):

在現(xiàn)行高頻介質(zhì)材料檢定系統(tǒng)中，檢定部門為高頻介質(zhì)損耗測量儀提供的測量標(biāo)準(zhǔn)是高頻標(biāo)準(zhǔn)介質(zhì)樣品。

In the current high frequency dielectric material test system, verification departmentfor measurement standards provide high frequency dielectric loss measuring instrument is high frequency standard media sample.

該樣品由人工藍寶石，石英玻璃，氧化鋁陶瓷，聚四氟乙烯，環(huán)氧板等材料做成Φ50mm，厚1～2mm測試樣品。用戶可按需訂購，以保證測試裝置的重復(fù)性和準(zhǔn)確性。

The sample consists of artificial sapphire, quartz glass, alumina ceramics, PTFE,epoxy board and other materials made of diameter 50mm, thickness 1 ~ 2mm test sample. The user can according to need to order, to ensure the repeatability and accuracy of the test device.

介電常數(shù)介質(zhì)損耗測試儀特點：

The dielectric constant, dielectric loss tester features:

◎ 本公司創(chuàng)新的自動Q值保持技術(shù)，使測Q分辨率至0.1Q，使tanδ分辨率至0.00005 。

Automatic Q \ \ the company innovation value keeping technology, enabling the measurement resolution of Q to 0.1Q, the tan delta resolution to 0.00005.

◎ 能對固體絕緣材料在10kHz～120MHz介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測試。

The energy of solid insulating materials in dielectric loss angle of 10kHz ~ 120MHz(tan delta) and Permittivity (epsilon) change test.

◎ 調(diào)諧回路殘余電感值低至8nH，保證100MHz的(tanδ)和(ε)的誤差較小。

The tuning circuit residual inductance values as low as 8nH, ensure that 100MHz(tan delta) and (E) the error is small.

◎ 特制LCD屏菜單式顯示多參數(shù)：Q值，測試頻率，調(diào)諧狀態(tài)等。

Multi parameter \ \ a special LCD screen menu display: Q value, the test frequency,the tuning status.

◎ Q值量程自動/手動量程控制。

The Q value range automatic / manual range control.

◎ DPLL合成發(fā)生1kHz～60MHz, 50kHz～160MHz測試信號。獨立信號源輸出口，所以本機又是一臺合成信號源。

The DPLL synthesis occurs 1kHz ~ 60MHz, 50kHz ~ 160MHz test signal.Independent signal source output port, so the machine is a synthetic signal source.

◎ 測試裝置符合國標(biāo)GB/T 1409-2006,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。

The test device to meet the national standard GB/T 1409-2006, ASTM D150 and IEC60250 specifications American Standard.

介電常數(shù)和介質(zhì)損耗測試儀工作頻率范圍是10kHz～120MHz,它能完成工作頻率內(nèi)材料的高頻介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測試。

The dielectric constant and dielectric loss tester operating frequency range is 10kHz ~ 120MHz, it can complete the working frequency of high frequency dielectric loss angle within (tan delta) and Permittivity (epsilon) change test.

本儀器中測試裝置是由平板電容器和測微圓筒線性電容器組成，平板電容器一般用來夾被測樣品，配用Q表作為指示儀器。

The instrument testing device is composed of a parallel plate capacitor and a micrometer cylinder linear capacitors, capacitor plate is generally used to clamp the sample, equipped with the Q table as indicating instrument.

絕緣材料的損耗角正切值是通過被測樣品放入平板電容器和不放樣品的Q值變化和厚度的刻度讀數(shù)通過公式計算得到。

Insulating material loss angle tangent value is calculated by the formula of scale reading through the measured sample into a flat capacitor and lofting products of Q value change and the thickness of the obtained.

同樣，由測微圓筒線性電容器的電容量讀數(shù)變化，通過公式計算得到介電常數(shù)。

Similarly, capacitance micrometer readings by change of cylindrical linearcapacitors, to obtain the dielectric constant calculated by the formula.

介電常數(shù)介質(zhì)損耗測試儀主要技術(shù)指標(biāo)：

The main technical indexes of the dielectric constant of dielectric loss tester:

2.1 tanδ和ε性能：

2.1 tan delta and epsilon performance:

2.1.1 固體絕緣材料測試頻率10kHz～120MHz的tanδ和ε變化的測試。

2.1.1 solid insulating materials testing frequency of 10kHz ~ tan delta and epsilonchanges in 120MHz test.

2.1.2 tanδ和ε測量范圍：

2.1.2 tan delta and epsilon measurement range:

tanδ：0.1～0.00005，ε：1～50

Tan delta: 0.1 ~ 0.00005, epsilon: 1 ~ 50

2.1.3 tanδ和ε測量精度（1MHz）：

2.1.3 tan delta and epsilon measurement precision (1MHz):

tanδ：±5%±0.00005，ε：±2%

Tan delta: + 5% + 0.00005, + 2% epsilon:

工作頻率范圍：50kHz～50MHz 四位數(shù)顯，壓控振蕩器

Frequency range: 50kHz ~ 50MHz four digits, voltage controlled oscillator

Q值測量范圍：1～1000三位數(shù)顯，±1Q分辨率

Q value measuring range: 1 ~ 1000 three digit display, plus or minus 1Q resolution

可調(diào)電容范圍：40～500 pF ΔC±3pF

Adjustable capacitance range: 40 ~ 500 pF Delta C + 3pF

電容測量誤差：±1%±1pF

Capacitance measurement error: + 1% + 1pF

Q表殘余電感值：約20nH

Residual inductance Q table: about 20nH

介電常數(shù)介質(zhì)損耗測試儀裝置：

The dielectric constant, dielectric loss tester:

2.3.1 平板電容器極片尺寸：:Φ38mm和Φ50mm二種.

2.3.1 plate capacitor pole piece size: diameter 38mm and a 50mm of two.

2.3.2 平板電容器間距可調(diào)范圍和分辨率：0～8mm， ±0.01mm

2.3.2 capacitor plate spacing adjustable range and resolution: 0 ~ 8mm, + 0.01mm

2.3.3 圓筒電容器線性： 0.33 pF /mm±0.05 pF,

2.3.3 cylindrical capacitor linear: 0.33 pF /mm + 0.05 pF,

2.3.4 圓筒電容器可調(diào)范圍：±12.5mm（±4.2pF）

2.3.4 cylindrical capacitor adjustable range: + 12.5mm (+ 4.2pF)

2.3.5 裝置插頭間距：25mm±0.1mm

2.3.5 device plug spacing: 25mm + 0.1mm

2.3.6 裝置損耗角正切值:≤2.5×10-4

2.3.6 device loss tangent: less than 2.5 * 10-4

標(biāo)簽：

介電常數(shù)測試儀

介電常數(shù)介質(zhì)損耗測試儀

介質(zhì)損耗因數(shù)測試儀

介電常數(shù)和介質(zhì)損耗測試儀

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